Memory Devices – 52

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52. Which of the following faults will the checkerboard pattern test for in RAM?

(a) Short between adjacent cells
(b) Ability to store both 0s and 1s
(c) Dynamically introduced between cells
(d) All of the above

Answer

Answer : (d)

Explanation

Explanation : No answer description available for this question. Let us discuss.

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Memory Devices - 68
555555555568. The checkerboard pattern test is used to test ________. (a) ROM (b) EEPROM (c) FPLA (d) RAM
Tags: test, memory, devices, checkerboard, pattern, ram, electronics, engineering
Memory Devices - 54
555555555554. When a RAM module passes the checkerboard test it is: (a) able to read and write only 1s. (b) faulty. (c) probably good. (d) able to read and write only 0s.
Tags: memory, devices, ram, checkerboard, test, electronics, engineering
Memory Devices - 123
5555555555123. What is the bit storage capacity of a ROM with a 1024 × 8 organization? (a) 1024 (b) 2048 (c) 4096 (d) 8192
Tags: memory, devices, electronics, engineering
Memory Devices - 151
5555555555151. Because 4096 = 212, a 4K × 1 RAM requires ________ address bits to access all locations. (a) 4096 (b) 10 (c) 12 (d) 1024
Tags: memory, devices, ram, electronics, engineering
Memory Devices - 152
5555555555152. The checksum method is used to test ________. (a) ROM (b) EEPROM (c) FPLA (d) RAM
Tags: memory, devices, test, ram, electronics, engineering

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